Reflection Coefficient Calculation of a Structure Including a Porous Silicon Layer with Transfer Matrix Method and FDTD

Porous silicon is an important material for a variety of application area such as anti-reflective coating solar cells. Today, cell market mostly dominated by based thin films are easy to fabricate and it compatible with technology. Designing porous layers critical issue enhance performance. There several methods calculate reflection coefficient layers. In this study, transfer matrix method finite-difference time-domain used Because gives more accurate results, the results obtained control method. method, refractive indices calculated Bruggeman effective medium approximation.